Abstract
This paper proposes a synaptic device based on charge-trap flash memory that has good CMOS compatibility and superior reliability characteristics compared with other synaptic devices. Using hot-electron injection and hot-hole injection, we designed operation methods to implement gradual conductance modulation and spike-timing-dependent plasticity. We demonstrate the feasibility of the device for neuromorphic applications through both a device-level technology computer-aided design simulation and a system-level MATLAB simulation. For the first time, we also propose a 3-D stacked synapse array and present the structure, operation, and process methods. The proposed array architecture features a small area and low process cost and could be a novel solution for neuromorphic systems for implementing deep neural networks.
Original language | English |
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Article number | 8556062 |
Pages (from-to) | 420-427 |
Number of pages | 8 |
Journal | IEEE Transactions on Electron Devices |
Volume | 66 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2019 |
Keywords
- 3-D neuromorphic system
- charge-trap flash (CTF) memory
- deep neural network (DNN)
- spike-time-dependent plasticity (STDP)
- stacked synapse array
- synapse device