Abstract
This article presents an energy-efficient high-resolution dual-residue (D-R) pipelined-successive approximation register (SAR) analog-to-digital converter (ADC), with a backend capacitive interpolating SAR ADC incorporated with noise-shaping (NS) capability. The residue amplifier design could be simplified as the residue is pre-amplified by the amplifier for the kT/C -noise cancellation. Moreover, the proposed segmented digital-to-analog converter (DAC) structure overcomes parasitic capacitance limitations in the capacitive interpolation, improving resolution along with the gain-error-free advantage of the D-R structure. Fabricated in a 180-nm CMOS technology, the prototype ADC achieves an 81.2-dB signal-to-noise and distortion ratio (SNDR) and an 89.9-dB spurious-free dynamic range (SFDR) in a 1.5-MHz bandwidth (BW) at an over-sampling ratio (OSR) of 8 with a 170.4-dB SNDR Schreier figure-of-merit (FoM) without any calibration.
Original language | English |
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Pages (from-to) | 2481-2491 |
Number of pages | 11 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 59 |
Issue number | 8 |
DOIs | |
State | Published - 2024 |
Keywords
- Analog-to-digital converter (ADC)
- capacitive interpolation
- high-resolution dual-residue (D-R) pipelined-successive approximation register (SAR) analog-to-digital converter (ADC)
- inter-stage gain error
- kT/C noise cancellation
- noise shaping (NS)
- quantization leakage error
- SAR-ADC
- segmented digital-to-analog converter (DAC)