Abstract
A new low voltage operation of high voltage switching technique, which is capable of reducing leakage current by an order of three compared to conventional circuits, has been developed for sub-1.8V low voltage mobile NAND flash memory. In addition, by using the proposed high voltage switch, chip size scaling can be realized due to reduced a minimum required space between the N-wells of selected and unselected blocks for isolation. The proposed scheme is essential to achieve low power operation NAND Flash memory, especially for mobile electronics.
Original language | English |
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Pages (from-to) | 182-186 |
Number of pages | 5 |
Journal | IEICE Transactions on Electronics |
Volume | E93-C |
Issue number | 2 |
DOIs | |
State | Published - 2010 |
Keywords
- Area scaling
- FLASH
- High voltage switch
- Low power
- Low voltage
- NAND
- Row decoder