Abstract
A new low voltage operation of high voltage switching technique, which is capable of reducing leakage current by an order of three compared to conventional circuits, has been developed for sub-1.8V low voltage mobile NAND flash memory. In addition, by using the proposed high voltage switch, chip size scaling can be realized due to reduced a minimum required space between the N-wells of selected and unselected blocks for isolation. The proposed scheme is essential to achieve low power operation NAND Flash memory, especially for mobile electronics.
| Original language | English |
|---|---|
| Pages (from-to) | 182-186 |
| Number of pages | 5 |
| Journal | IEICE Transactions on Electronics |
| Volume | E93-C |
| Issue number | 2 |
| DOIs | |
| State | Published - 2010 |
Keywords
- Area scaling
- FLASH
- High voltage switch
- Low power
- Low voltage
- NAND
- Row decoder