A simple compact model for hot carrier injection phenomenon in 32 nm NAND flash memory device

Myounggon Kang, Wookghee Hahn, Il Han Park, Hocheol Lee, Juyoung Park, Youngsun Song, Changgyu Eun, Sanghyun Ju, Kihwan Choi, Youngho Lim, Jong Ho Lee, Byung Gook Park, Hyungcheol Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

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