Abstract
This work presents a 12 bit 200 MS/s dual-residue pipelined successive approximation registers (SAR) analog-to-digital converter (ADC) with a single open-loop residue amplifier (RA). By using the inherent characteristics of the SAR conversion scheme, the proposed ADC sequentially gen-erates two residue levels from the single RA, which eliminates the need for inter-stage gain-matching calibration. To convert the sequentially generated the two residues, a capacitive interpolating SAR ADC (I-SAR ADC) is also proposed. The I-SAR ADC is very compact because it consists of the one comparator, a CDAC, and control logic like a conventional SAR ADC. In addition, the I-SAR ADC needs no static power dissipation for the residue interpolation. A prototype ADC fabricated in a 40 nm CMOS technology occupies an active area of 0.026 mm2 . At a 200 MS/s sampling-rate with the Nyquist input, the ADC achieves an SNDR (Signal-to-Noise distortion ratio) of 62.1 dB and 67.1 dB SFDR (Spurious-Free Dynamic Range), respectively. The total power consumed is 3.9 mW under a 0.9 V supply. Without any inter-stage mismatch calibration, the ADC achieve Walden Figure-of-Merit (FoM) of 19.0 fJ/conversion-step.
Original language | English |
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Article number | 421 |
Pages (from-to) | 1-14 |
Number of pages | 14 |
Journal | Electronics (Switzerland) |
Volume | 10 |
Issue number | 4 |
DOIs | |
State | Published - 2 Feb 2021 |
Keywords
- Analog-to-digital converter (ADC)
- Calibration-free
- Capacitive interpolation
- Dual-residue
- High speed and high resolution
- Inter-stage mismatch
- Low power
- Open-loop residue amplifier
- Pipelined-SAR architecture
- Successive-approximation-register (SAR)