TY - JOUR
T1 - A Single-Supply CDAC-Based Buffer-Embedding SAR ADC with Skip-Reset Scheme Having Inherent Chopping Capability
AU - Seo, Min Jae
AU - Jin, Dong Hwan
AU - Kim, Ye Dam
AU - Kim, Jong Pal
AU - Ryu, Seung Tak
N1 - Publisher Copyright:
© 1966-2012 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - This article presents a power-efficient buffer-embedding successive approximation register (SAR) analog-To-digital converter (ADC) that utilizes a core power supply for the source-follower buffer, having a rail-To-rail signal swing due to the capacitive-level shifting bias scheme. Also, to implement the switched-capacitor (SC) level-shifting bias scheme without bias leakage issue, a negative boosting circuit is proposed. The boosting circuit is designed without any reliability issue, even with the use of thin-oxide transistors. For low-power applications, such as the biomedical system and CMOS image sensor, the proposed ADC incorporates a skip-reset (SR) scheme, a low-power delta-readout method. In conjunction with 8 \times oversampling and the power-saving SR technique that has inherent chopping capability, a prototype SAR ADC fabricated in a 180-nm CMOS technology achieves a peak 74.8-dB signal-To-noise and distortion ratio (SNDR) and an 89.1-dB spurious free dynamic range (SFDR) for a 640-kHz bandwidth (BW) with an oversampling ratio (OSR) of 8, resulting in a Schreier figure of merit (FoM) of 167.3 dB. The chip area occupies 0.192 mm2, and the power consumption is 180.1 \mu \text{W}.
AB - This article presents a power-efficient buffer-embedding successive approximation register (SAR) analog-To-digital converter (ADC) that utilizes a core power supply for the source-follower buffer, having a rail-To-rail signal swing due to the capacitive-level shifting bias scheme. Also, to implement the switched-capacitor (SC) level-shifting bias scheme without bias leakage issue, a negative boosting circuit is proposed. The boosting circuit is designed without any reliability issue, even with the use of thin-oxide transistors. For low-power applications, such as the biomedical system and CMOS image sensor, the proposed ADC incorporates a skip-reset (SR) scheme, a low-power delta-readout method. In conjunction with 8 \times oversampling and the power-saving SR technique that has inherent chopping capability, a prototype SAR ADC fabricated in a 180-nm CMOS technology achieves a peak 74.8-dB signal-To-noise and distortion ratio (SNDR) and an 89.1-dB spurious free dynamic range (SFDR) for a 640-kHz bandwidth (BW) with an oversampling ratio (OSR) of 8, resulting in a Schreier figure of merit (FoM) of 167.3 dB. The chip area occupies 0.192 mm2, and the power consumption is 180.1 \mu \text{W}.
KW - Analog-To-digital converter (ADC)
KW - capacitivelevel shifting
KW - delta (Δ) searching
KW - loop-embedded input buffer
KW - low power
KW - push-pull source follower (SF)
KW - skip-reset (SR)
KW - successive approximation register (SAR)
UR - http://www.scopus.com/inward/record.url?scp=85089372752&partnerID=8YFLogxK
U2 - 10.1109/JSSC.2020.3006450
DO - 10.1109/JSSC.2020.3006450
M3 - Article
AN - SCOPUS:85089372752
SN - 0018-9200
VL - 55
SP - 2660
EP - 2669
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
IS - 10
M1 - 9139322
ER -