TY - GEN
T1 - A substrate integrated waveguide probe applicable to broadband complex permittivity measurements
AU - Kim, Namgon
AU - Bang, Yong Seung
AU - Kim, Kihyun
AU - Cheon, Changyul
AU - Kim, Yong Kweon
AU - Kwon, Youngwoo
PY - 2011
Y1 - 2011
N2 - A planar-type open-ended coaxial probe with substrate integrated waveguide structure has been developed for broadband permittivity measurement. The proposed probe consists of a microstrip line, a shielded stripline, and a coaxial aperture. The shielded stripline was formed by placing via-hole arrays along the stripline to form a substrate integrated waveguide. To access the bandwidth of the proposed probe, back-to-back transmission lines with various via spacings are characterized. Based on this data, substrate integrated waveguide probes are designed and fabricated to measure the complex permittivity of 0.9 % saline up to 30 GHz. A 5 mm-wide substrate integrated waveguide probe with 2 mm via spacing shows distortion-free permittivity measurement up to 30 GHz, which is more than twice the bandwidth available from the conventional planar coaxial probe with the same probe width. The concept can be applied to silicon substrate, allowing a fully integrated active probe for broadband measurements.
AB - A planar-type open-ended coaxial probe with substrate integrated waveguide structure has been developed for broadband permittivity measurement. The proposed probe consists of a microstrip line, a shielded stripline, and a coaxial aperture. The shielded stripline was formed by placing via-hole arrays along the stripline to form a substrate integrated waveguide. To access the bandwidth of the proposed probe, back-to-back transmission lines with various via spacings are characterized. Based on this data, substrate integrated waveguide probes are designed and fabricated to measure the complex permittivity of 0.9 % saline up to 30 GHz. A 5 mm-wide substrate integrated waveguide probe with 2 mm via spacing shows distortion-free permittivity measurement up to 30 GHz, which is more than twice the bandwidth available from the conventional planar coaxial probe with the same probe width. The concept can be applied to silicon substrate, allowing a fully integrated active probe for broadband measurements.
KW - Complex permittivity
KW - planar coaxial probe
KW - substrate integrated waveguide
UR - http://www.scopus.com/inward/record.url?scp=80052318691&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2011.5972969
DO - 10.1109/MWSYM.2011.5972969
M3 - Conference contribution
AN - SCOPUS:80052318691
SN - 9781612847566
T3 - IEEE MTT-S International Microwave Symposium Digest
BT - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011
T2 - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011
Y2 - 5 June 2011 through 10 June 2011
ER -