Adsorption of single oxygen atoms on vicinal Si(001) surfaces: Lattice relaxation and Si oxidation

Jin Nam Yeo, Lan Hee Yang, B. D. Yu

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Abstract

By employing ab initio electronic structure calculations, we investigated the adsorption of single oxygen atoms on vicinal Si(001) surfaces with single-layer SA and SB steps. The calculations in this study showed that the oxygen adatom preferetially adsorbs not only on the rebond sites of the rebonded step-edge Si atoms (RSAs) at the SB step but also on the backbond site of the down Si atom of the step-edge Si dimer on the upper terrace of the SB step. For more detailed information, the electronic properties of the adsorption structures of the oxygen adatoms were also examined. All these calculations showed that the lattice relaxation of the RSAs near the rebonded SB step played a significant role in the adsorption of the single oxygen atoms on the vicianl Si(001) surfaces with the single-layer steps.

Original languageEnglish
Pages (from-to)115-120
Number of pages6
JournalJournal of the Korean Physical Society
Volume54
Issue number1
DOIs
StatePublished - Jan 2009

Keywords

  • Ab initio calculations
  • Lattice relaxation
  • Si oxidation
  • Single-layer steps
  • Vicinal Si(001) surfaces

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