An accurate broadband measurement of substrate dielectric constant

Moon Que Lee; Sangwook Nam

doi:10.1109/75.481077

An accurate broadband measurement of substrate dielectric constant

Moon Que Lee, Sangwook Nam

School of Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

114 Scopus citations

Abstract

An improved two-microstrip line method is proposed for a simple and accurate measurement of the dielectric constants of substrates. The errors due to the transition mismatches and connection repeatability are removed by using the selection algorithm of the best data set in multiple measurements, based on the minimum error cost concept. The measurement data for CGP-500 substrate in broad frequency range (0.5-25.5 GHz) are shown and the result agrees quite well with the theoretical one.

Original language	English
Pages (from-to)	168-170
Number of pages	3
Journal	IEEE Microwave and Guided Wave Letters
Volume	6
Issue number	4
DOIs	https://doi.org/10.1109/75.481077
State	Published - Apr 1996

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10.1109/75.481077

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title = "An accurate broadband measurement of substrate dielectric constant",

abstract = "An improved two-microstrip line method is proposed for a simple and accurate measurement of the dielectric constants of substrates. The errors due to the transition mismatches and connection repeatability are removed by using the selection algorithm of the best data set in multiple measurements, based on the minimum error cost concept. The measurement data for CGP-500 substrate in broad frequency range (0.5-25.5 GHz) are shown and the result agrees quite well with the theoretical one.",

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AB - An improved two-microstrip line method is proposed for a simple and accurate measurement of the dielectric constants of substrates. The errors due to the transition mismatches and connection repeatability are removed by using the selection algorithm of the best data set in multiple measurements, based on the minimum error cost concept. The measurement data for CGP-500 substrate in broad frequency range (0.5-25.5 GHz) are shown and the result agrees quite well with the theoretical one.

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JO - IEEE Microwave and Guided Wave Letters

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An accurate broadband measurement of substrate dielectric constant

Abstract

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