An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon; Sangwook Oh; Hyungkwon Kim; Sanghoon Sull; Sungwoo Hwang; Doyeol Ahn; Youngju Park; Eunkyu Kim

doi:10.1063/1.1497503

An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon, Sangwook Oh, Hyungkwon Kim, Sanghoon Sull, Sungwoo Hwang, Doyeol Ahn, Youngju Park, Eunkyu Kim

School of Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English
Pages (from-to)	3245
Number of pages	1
Journal	Review of Scientific Instruments
Volume	73
Issue number	9
DOIs	https://doi.org/10.1063/1.1497503
State	Published - Sep 2002

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10.1063/1.1497503

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title = "An automated glitch-detection/restoration method of atomic force microscope images",

author = "Chankyeong Hyon and Sangwook Oh and Hyungkwon Kim and Sanghoon Sull and Sungwoo Hwang and Doyeol Ahn and Youngju Park and Eunkyu Kim",

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journal = "Review of Scientific Instruments",

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AU - Hyon, Chankyeong

AU - Oh, Sangwook

AU - Kim, Hyungkwon

AU - Sull, Sanghoon

AU - Hwang, Sungwoo

AU - Ahn, Doyeol

AU - Park, Youngju

AU - Kim, Eunkyu

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SP - 3245

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

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An automated glitch-detection/restoration method of atomic force microscope images

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