An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon; Sangwook Oh; Hyungkwon Kim; Sanghoon Sull; Sungwoo Hwang; Doyeol Ahn; Youngju Park; Eunkyu Kim

doi:10.1063/1.1497503

An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon
, Sangwook Oh
, Hyungkwon Kim
, Sanghoon Sull
, Sungwoo Hwang
, Doyeol Ahn
, Youngju Park
, Eunkyu Kim

School of Electrical and Computer Engineering

Korea University
Korea Institute of Science and Technology

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English
Pages (from-to)	3245
Number of pages	1
Journal	Review of Scientific Instruments
Volume	73
Issue number	9
DOIs	https://doi.org/10.1063/1.1497503
State	Published - Sep 2002

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10.1063/1.1497503

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title = "An automated glitch-detection/restoration method of atomic force microscope images",

author = "Chankyeong Hyon and Sangwook Oh and Hyungkwon Kim and Sanghoon Sull and Sungwoo Hwang and Doyeol Ahn and Youngju Park and Eunkyu Kim",

year = "2002",

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doi = "10.1063/1.1497503",

language = "English",

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pages = "3245",

journal = "Review of Scientific Instruments",

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T1 - An automated glitch-detection/restoration method of atomic force microscope images

AU - Hyon, Chankyeong

AU - Oh, Sangwook

AU - Kim, Hyungkwon

AU - Sull, Sanghoon

AU - Hwang, Sungwoo

AU - Ahn, Doyeol

AU - Park, Youngju

AU - Kim, Eunkyu

PY - 2002/9

Y1 - 2002/9

UR - https://www.scopus.com/pages/publications/18544390511

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DO - 10.1063/1.1497503

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AN - SCOPUS:18544390511

SN - 0034-6748

VL - 73

SP - 3245

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 9

ER -

An automated glitch-detection/restoration method of atomic force microscope images

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