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Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-Film Transistors
Tae Jun Yang, Je Hyuk Kim, Chang I.I. Ryoo, Seung Joo Myoung, Changwook Kim, Ju Heyuck Baeck, Jong Uk Bae, Jiyong Noh, Seok Woo Lee, Kwon Shik Park, Jeom Jae Kim, Soo Young Yoon, Yoon Kim, Dae Hwan Kim
Research output: Contribution to journal › Article › peer-review