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Analysis of failure mechanisms and extraction of activation energies (Ea) in 21-nm nand flash cells

  • Kyunghwan Lee
  • , Myounggon Kang
  • , Seongjun Seo
  • , Dong Hua Li
  • , Jungki Kim
  • , Hyungcheol Shin
  • Seoul National University
  • Samsung

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

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