Bulk-fin field-effect transistor-based capacitorless dynamic random-access memory and its immunity to the work-function variation effect
- Sang Ho Lee
- , Jin Park
- , Geon Uk Kim
- , Ga Eon Kang
- , Jun Hyeok Heo
- , So Ra Jeon
- , Young Jun Yoon
- , Jae Hwa Seo
- , Jaewon Jang
- , Jin Hyuk Bae
- , Sin Hyung Lee
- , In Man Kang
- Kyungpook National University
- Korea Atomic Energy Research Institute
- Korea Electrotechnology Research Institute
Research output: Contribution to journal › Article › peer-review
6
Scopus
citations