Bulk-fin field-effect transistor-based capacitorless dynamic random-access memory and its immunity to the work-function variation effect

Sang Ho Lee, Jin Park, Geon Uk Kim, Ga Eon Kang, Jun Hyeok Heo, So Ra Jeon, Young Jun Yoon, Jae Hwa Seo, Jaewon Jang, Jin Hyuk Bae, Sin Hyung Lee, In Man Kang

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

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