Abstract
The cobalt silicides were investigated for employment as a catalytic layer for a DSSC. Using an E-gun evaporation process, we prepared a sample of 100 nm-thick cobalt on a p-type Si (100) wafer. To form cobalt silicides, the samples were annealed at temperatures of 300 °C, 500 °C, and 700 °C for 30 minutes in a vacuum. Four-point probe, XRD, FE-SEM, and CV analyses were used to determine the sheet resistance, phase, microstructure, and catalytic activity of the cobalt silicides. To confirm the corrosion stability, we also checked the microstructure change of the cobalt silicides after dipping into iodide electrolyte. Through the sheet resistance and XRD results, we determined that Co2Si, CoSi, and CoSi2 were formed successfully by annealing at 300 °C, 500 °C, and 700 °C, respectively. The microstructure analysis results showed that all the cobalt silicides were formed uniformly, and CoSi and CoSi2 layers were very stable even after dipping in the iodide electrolyte. The CV result showed that CoSi and CoSi2 exhibit catalytic activities 67 % and 54 % that of Pt. Our results for Co2Si, CoSi, and CoSi2 revealed that CoSi and CoSi2 could be employed as catalyst for a DSSC.
| Original language | English |
|---|---|
| Pages (from-to) | 401-405 |
| Number of pages | 5 |
| Journal | Korean Journal of Materials Research |
| Volume | 26 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2016 |
Keywords
- Annealing
- Catalytic activity
- Cobalt silicide
- Cyclic voltammetry
- Reduction catalyst
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