Abstract
The investigation of the Dual-k spacer through comparative analysis of single nanowire-FET(NWFET)/3-stack NWFET and underlap/overlap channel is conducted. It is known that the dug 3-stack NWFET has better delay characteristics than single NWFET with the use of high permittivity material of Cin in Dual-k spacer structure. In addition, there is no difference of delay between overlap and underlap channel when it used Dual-k spacer structure but underlap channel of Dual-k 3-stack NWFET shows better short channel immunity.
Original language | English |
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Pages (from-to) | 64-68 |
Number of pages | 5 |
Journal | Solid-State Electronics |
Volume | 140 |
DOIs | |
State | Published - Feb 2018 |
Keywords
- Dual-k spacer
- High-to-low propagation delay
- Intrinsic gate delay
- Nanowire-FET
- Underlap channel