Comparison of dual-k spacer and single-k spacer for single NWFET and 3-stack NWFET

Hyungwoo Ko, Jongsu Kim, Minsoo Kim, Myounggon Kang, Hyungcheol Shin

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The investigation of the Dual-k spacer through comparative analysis of single nanowire-FET(NWFET)/3-stack NWFET and underlap/overlap channel is conducted. It is known that the dug 3-stack NWFET has better delay characteristics than single NWFET with the use of high permittivity material of Cin in Dual-k spacer structure. In addition, there is no difference of delay between overlap and underlap channel when it used Dual-k spacer structure but underlap channel of Dual-k 3-stack NWFET shows better short channel immunity.

Original languageEnglish
Pages (from-to)64-68
Number of pages5
JournalSolid-State Electronics
Volume140
DOIs
StatePublished - Feb 2018

Keywords

  • Dual-k spacer
  • High-to-low propagation delay
  • Intrinsic gate delay
  • Nanowire-FET
  • Underlap channel

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