Complex dynamics of carbon nanotube probe tips

S. I. Lee; S. W. Howell; A. Raman; R. Reifenberger; C. V. Nguyen; M. Meyyappan

doi:10.1016/j.ultramic.2004.09.012

Complex dynamics of carbon nanotube probe tips

S. I. Lee, S. W. Howell, A. Raman, R. Reifenberger, C. V. Nguyen, M. Meyyappan

Department of Mechanical and Information Engineering

Research output: Contribution to journal › Article › peer-review

25 Scopus citations

Abstract

Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip. Higher harmonics of the microcantilever are measured in frequency ranges corresponding to attractive regime and the repulsive regime where the CNT buckles dynamically. Surface scanning is performed using a MWCNT tip on a SiO ₂ grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.

Original language	English
Pages (from-to)	95-102
Number of pages	8
Journal	Ultramicroscopy
Volume	103
Issue number	2
DOIs	https://doi.org/10.1016/j.ultramic.2004.09.012
State	Published - May 2005

Keywords

Atomic force microscopes
Carbon nanotubes
Nonlinear dynamics

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10.1016/j.ultramic.2004.09.012

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@article{36b88dbc9b02433ca497215539df70de,

title = "Complex dynamics of carbon nanotube probe tips",

abstract = "Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip. Higher harmonics of the microcantilever are measured in frequency ranges corresponding to attractive regime and the repulsive regime where the CNT buckles dynamically. Surface scanning is performed using a MWCNT tip on a SiO 2 grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.",

keywords = "Atomic force microscopes, Carbon nanotubes, Nonlinear dynamics",

author = "Lee, {S. I.} and Howell, {S. W.} and A. Raman and R. Reifenberger and Nguyen, {C. V.} and M. Meyyappan",

year = "2005",

month = may,

doi = "10.1016/j.ultramic.2004.09.012",

language = "English",

volume = "103",

pages = "95--102",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "2",

}

TY - JOUR

T1 - Complex dynamics of carbon nanotube probe tips

AU - Lee, S. I.

AU - Howell, S. W.

AU - Raman, A.

AU - Reifenberger, R.

AU - Nguyen, C. V.

AU - Meyyappan, M.

PY - 2005/5

Y1 - 2005/5

N2 - Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip. Higher harmonics of the microcantilever are measured in frequency ranges corresponding to attractive regime and the repulsive regime where the CNT buckles dynamically. Surface scanning is performed using a MWCNT tip on a SiO 2 grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.

AB - Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip. Higher harmonics of the microcantilever are measured in frequency ranges corresponding to attractive regime and the repulsive regime where the CNT buckles dynamically. Surface scanning is performed using a MWCNT tip on a SiO 2 grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.

KW - Atomic force microscopes

KW - Carbon nanotubes

KW - Nonlinear dynamics

UR - http://www.scopus.com/inward/record.url?scp=14844349996&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2004.09.012

DO - 10.1016/j.ultramic.2004.09.012

M3 - Article

AN - SCOPUS:14844349996

SN - 0304-3991

VL - 103

SP - 95

EP - 102

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 2

ER -

Complex dynamics of carbon nanotube probe tips

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Keywords

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