Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution

Jeongjin Lee; Inhee Choi; Surin Hong; Su Seung Lee; Young In Yang; Younghun Kim; Jongheop Yi

doi:10.1016/j.ultramic.2008.04.077

Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution

Jeongjin Lee, Inhee Choi, Surin Hong, Su Seung Lee, Young In Yang, Younghun Kim, Jongheop Yi

Department of Life Science

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A photoconductive atomic force microscopy (pcAFM) module was designed and the performance was tested. This module consisted of three units: the conductive mirror-plate, the steering mirror and the laser source. The module with a laser irradiation unit was equipped to a conventional conducting probe atomic force microscopy (CP-AFM) instrument to measure photoconductance in a nanoscale resolution. As a proof-of-concept experiment, the photoconductance of aggregated fullerene on indium tin oxide (ITO) substrate was measured with this module. The electrical signals (currents) of aggregated fullerene under the conditions of laser on/off at about -10 V sample bias voltage were -100 to -160 nA and 0 to -20 nA, respectively. Results indicated that the pcAFM with this module allowed one to observe photoinduced changes of electrical properties in nanodevices with nanoscale spatial resolution.

Original language	English
Pages (from-to)	1090-1093
Number of pages	4
Journal	Ultramicroscopy
Volume	108
Issue number	10
DOIs	https://doi.org/10.1016/j.ultramic.2008.04.077
State	Published - Sep 2008

Keywords

AFM module
Atomic force microscopy (AFM)
Conducting probe AFM (CP-AFM)
Fullerene (C)
Photoconductive AFM (pcAFM)

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10.1016/j.ultramic.2008.04.077

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@article{7118f19e26554547bef95e44213f34e0,

title = "Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution",

abstract = "A photoconductive atomic force microscopy (pcAFM) module was designed and the performance was tested. This module consisted of three units: the conductive mirror-plate, the steering mirror and the laser source. The module with a laser irradiation unit was equipped to a conventional conducting probe atomic force microscopy (CP-AFM) instrument to measure photoconductance in a nanoscale resolution. As a proof-of-concept experiment, the photoconductance of aggregated fullerene on indium tin oxide (ITO) substrate was measured with this module. The electrical signals (currents) of aggregated fullerene under the conditions of laser on/off at about -10 V sample bias voltage were -100 to -160 nA and 0 to -20 nA, respectively. Results indicated that the pcAFM with this module allowed one to observe photoinduced changes of electrical properties in nanodevices with nanoscale spatial resolution.",

keywords = "AFM module, Atomic force microscopy (AFM), Conducting probe AFM (CP-AFM), Fullerene (C), Photoconductive AFM (pcAFM)",

author = "Jeongjin Lee and Inhee Choi and Surin Hong and Lee, {Su Seung} and Yang, {Young In} and Younghun Kim and Jongheop Yi",

year = "2008",

month = sep,

doi = "10.1016/j.ultramic.2008.04.077",

language = "English",

volume = "108",

pages = "1090--1093",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "10",

}

TY - JOUR

T1 - Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution

AU - Lee, Jeongjin

AU - Choi, Inhee

AU - Hong, Surin

AU - Lee, Su Seung

AU - Yang, Young In

AU - Kim, Younghun

AU - Yi, Jongheop

PY - 2008/9

Y1 - 2008/9

N2 - A photoconductive atomic force microscopy (pcAFM) module was designed and the performance was tested. This module consisted of three units: the conductive mirror-plate, the steering mirror and the laser source. The module with a laser irradiation unit was equipped to a conventional conducting probe atomic force microscopy (CP-AFM) instrument to measure photoconductance in a nanoscale resolution. As a proof-of-concept experiment, the photoconductance of aggregated fullerene on indium tin oxide (ITO) substrate was measured with this module. The electrical signals (currents) of aggregated fullerene under the conditions of laser on/off at about -10 V sample bias voltage were -100 to -160 nA and 0 to -20 nA, respectively. Results indicated that the pcAFM with this module allowed one to observe photoinduced changes of electrical properties in nanodevices with nanoscale spatial resolution.

AB - A photoconductive atomic force microscopy (pcAFM) module was designed and the performance was tested. This module consisted of three units: the conductive mirror-plate, the steering mirror and the laser source. The module with a laser irradiation unit was equipped to a conventional conducting probe atomic force microscopy (CP-AFM) instrument to measure photoconductance in a nanoscale resolution. As a proof-of-concept experiment, the photoconductance of aggregated fullerene on indium tin oxide (ITO) substrate was measured with this module. The electrical signals (currents) of aggregated fullerene under the conditions of laser on/off at about -10 V sample bias voltage were -100 to -160 nA and 0 to -20 nA, respectively. Results indicated that the pcAFM with this module allowed one to observe photoinduced changes of electrical properties in nanodevices with nanoscale spatial resolution.

KW - AFM module

KW - Atomic force microscopy (AFM)

KW - Conducting probe AFM (CP-AFM)

KW - Fullerene (C)

KW - Photoconductive AFM (pcAFM)

UR - http://www.scopus.com/inward/record.url?scp=49949110503&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2008.04.077

DO - 10.1016/j.ultramic.2008.04.077

M3 - Article

AN - SCOPUS:49949110503

SN - 0304-3991

VL - 108

SP - 1090

EP - 1093

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 10

ER -

Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution

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Keywords

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