Controlling the magnetic properties of layered Cr2Te3 thin films via ex-situ annealing

In Hak Lee, Yeong Gwang Khim, Jaeun Eom, Jung Yun Kee, Byoung Ki Choi, Hyuk Jin Kim, Ryung Kim, Min Young Jung, Kyeong Jun Lee, Younghak Kim, Woo Suk Noh, Byeong hyeon Lee, Hoyoung Suh, Hye Jung Chang, Sung Ok Won, Chaun Jang, Hyejin Ryu, Dong Ryeol Lee, Seo Hyoung Chang, Hyun Hwi LeeYoung Jun Chang, Jun Woo Choi

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


We present a post-growth ex-situ annealing method to control the Curie temperature and magnetic anisotropy of Cr2Te3 van der Waals ferromagnetic thin films. The as-grown Cr2Te3 films exhibit a Curie temperature ∼ 170 K with an out-of-plane magnetic easy axis. Upon high temperature (300 – 400 °C) ex-situ annealing, the magnetic phase of the film changes: the Curie temperature is significantly increased to ∼ 300 K and the magnetic easy axis is reoriented to the in-plane direction. Electronic, chemical, and structural analyses suggest that the c-axis lattice constant expansion, accompanying the annealing process, is the origin of the ex-situ-annealing-induced modulation of the Cr2Te3 film magnetic properties. These results demonstrate that a practical ex-situ annealing process can be effectively used to control the magnetic properties of van der Waals ferromagnetic thin films. Furthermore, the room temperature ferromagnetic ordering emerging upon annealing, along with its robustness against post-growth thermal processes, suggests that the Cr2Te3 thin film is a promising magnetic material candidate for potential application in van-der-Waals-material-based spintronic devices.

Original languageEnglish
Article number159057
JournalApplied Surface Science
StatePublished - 1 Mar 2024


  • CrTe thin films
  • Curie temperature
  • Ex-situ annealing
  • Lattice expansion
  • van der Waals magnetic materials


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