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Correction to “An Accurate Broad-Band Measurement of Substrate Dielectric Constant”

  • Seoul National University

Research output: Contribution to journalComment/debate

6 Scopus citations
Original languageEnglish
Pages (from-to)299
Number of pages1
JournalIEEE Microwave and Guided Wave Letters
Volume6
Issue number8
DOIs
StatePublished - Aug 1996

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