Abstract
In the original version of this article, the affiliation details for Do Hyun Jung were incorrectly given. It should have been ‘‘Department of Materials Science and Engineering, University of Seoul, 163 Seoulsiripdaero, Dongdaemun-gu, Seoul 02504, Korea’’ and ‘‘Lightweight New Materials Technology Center, Gyeongbuk Technopark, Yeongju 36040, Korea’’. This has been corrected by publishing this correction article.
| Original language | English |
|---|---|
| Pages (from-to) | 11624 |
| Number of pages | 1 |
| Journal | Journal of Materials Science: Materials in Electronics |
| Volume | 33 |
| Issue number | 14 |
| DOIs |
|
| State | Published - May 2022 |
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Dive into the research topics of 'Correction to: Investigating the physical, mechanical, and reliability study of high entropy alloy reinforced Sn–3.0Ag–0.5Cu solder using 1608 chip capacitor/ENIG joints (Journal of Materials Science: Materials in Electronics, (2022), 33, 7, (3687-3710), 10.1007/s10854-021-07562-2)'. Together they form a unique fingerprint.Cite this
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