Abstract
The thermoelectric transport properties of artificially textured polycrystalline CrSiTe3 samples have been investigated for elucidating their correlations with a crystal structure and the corresponding charge density distribution. We verified that the low mobility of 13–27 cm2 V−1 s−1 attributing poor electronic transport properties is originated from the discrete charge density distribution in the covalently bonded layer. Also, the modulation of thermal conductivity values from 3.5 to 5.4 W m−1 K−1 with varying the texture was confirmed in pristine CrSiTe3. Thus, we suggest that the electronic and thermal transport properties of layer structured CrSiTe3 are strongly correlated with crystallographic features.
Original language | English |
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Pages (from-to) | 93-98 |
Number of pages | 6 |
Journal | Journal of Alloys and Compounds |
Volume | 790 |
DOIs | |
State | Published - 25 Jun 2019 |
Keywords
- Charge distribution
- CrSiTe
- Crystallographic structure
- Rietveld refinement
- Thermoelectric