Abstract
The thermoelectric transport properties of artificially textured polycrystalline CrSiTe3 samples have been investigated for elucidating their correlations with a crystal structure and the corresponding charge density distribution. We verified that the low mobility of 13–27 cm2 V−1 s−1 attributing poor electronic transport properties is originated from the discrete charge density distribution in the covalently bonded layer. Also, the modulation of thermal conductivity values from 3.5 to 5.4 W m−1 K−1 with varying the texture was confirmed in pristine CrSiTe3. Thus, we suggest that the electronic and thermal transport properties of layer structured CrSiTe3 are strongly correlated with crystallographic features.
| Original language | English |
|---|---|
| Pages (from-to) | 93-98 |
| Number of pages | 6 |
| Journal | Journal of Alloys and Compounds |
| Volume | 790 |
| DOIs | |
| State | Published - 25 Jun 2019 |
Keywords
- Charge distribution
- CrSiTe
- Crystallographic structure
- Rietveld refinement
- Thermoelectric