Critical thickness of ultrathin ferroelectric BaTi O3 films
- Y. S. Kim
- , D. H. Kim
- , J. D. Kim
- , Y. J. Chang
- , T. W. Noh
- , J. H. Kong
- , K. Char
- , Y. D. Park
- , S. D. Bu
- , J. G. Yoon
- , J. S. Chung
- Seoul National University
- Jeonbuk National University
- Suwon University
- Soongsil University
Research output: Contribution to journal › Article › peer-review
244
Scopus
citations