Dependence of approaching velocity on the force-distance curve in AFM analysis

Younghun Kim; Young In Yang; Inhee Choi; Jongheop Yi

doi:10.1007/s11814-009-0314-4

Dependence of approaching velocity on the force-distance curve in AFM analysis

Younghun Kim, Young In Yang, Inhee Choi, Jongheop Yi

Department of Life Science

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of V_z on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a V_z of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under V_z of 1 μm/s or use of a short/stiff cantilever.

Original language	English
Pages (from-to)	324-327
Number of pages	4
Journal	Korean Journal of Chemical Engineering
Volume	27
Issue number	1
DOIs	https://doi.org/10.1007/s11814-009-0314-4
State	Published - Jan 2010

Keywords

AFM
Force-distance Curve
Image Disrotion

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10.1007/s11814-009-0314-4

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@article{ea1d7415d73f41368d8609bc88fb37a1,

title = "Dependence of approaching velocity on the force-distance curve in AFM analysis",

abstract = "The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of Vz on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a Vz of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under Vz of 1 μm/s or use of a short/stiff cantilever.",

keywords = "AFM, Force-distance Curve, Image Disrotion",

author = "Younghun Kim and Yang, {Young In} and Inhee Choi and Jongheop Yi",

year = "2010",

month = jan,

doi = "10.1007/s11814-009-0314-4",

language = "English",

volume = "27",

pages = "324--327",

journal = "Korean Journal of Chemical Engineering",

issn = "0256-1115",

publisher = "Springer",

number = "1",

}

TY - JOUR

T1 - Dependence of approaching velocity on the force-distance curve in AFM analysis

AU - Kim, Younghun

AU - Yang, Young In

AU - Choi, Inhee

AU - Yi, Jongheop

PY - 2010/1

Y1 - 2010/1

N2 - The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of Vz on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a Vz of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under Vz of 1 μm/s or use of a short/stiff cantilever.

AB - The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of Vz on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a Vz of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under Vz of 1 μm/s or use of a short/stiff cantilever.

KW - AFM

KW - Force-distance Curve

KW - Image Disrotion

UR - http://www.scopus.com/inward/record.url?scp=74249119043&partnerID=8YFLogxK

U2 - 10.1007/s11814-009-0314-4

DO - 10.1007/s11814-009-0314-4

M3 - Article

AN - SCOPUS:74249119043

SN - 0256-1115

VL - 27

SP - 324

EP - 327

JO - Korean Journal of Chemical Engineering

JF - Korean Journal of Chemical Engineering

IS - 1

ER -

Dependence of approaching velocity on the force-distance curve in AFM analysis

Abstract

Keywords

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