Dependence of Positive Bias Stress Instability on Threshold Voltage and Its Origin in Solution-Processed Aluminum-Doped Indium Oxide Thin-Film Transistors

Jeong Hyeon Na, Jun Hyeong Park, Won Park, Junhao Feng, Jun Su Eun, Jinuk Lee, Sin Hyung Lee, Jaewon Jang, In Man Kang, Do Kyung Kim, Jin Hyuk Bae

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