Dependence of Positive Bias Stress Instability on Threshold Voltage and Its Origin in Solution-Processed Aluminum-Doped Indium Oxide Thin-Film Transistors

  • Jeong Hyeon Na
  • , Jun Hyeong Park
  • , Won Park
  • , Junhao Feng
  • , Jun Su Eun
  • , Jinuk Lee
  • , Sin Hyung Lee
  • , Jaewon Jang
  • , In Man Kang
  • , Do Kyung Kim
  • , Jin Hyuk Bae

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

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