Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum

A particle characteristics diagnosis system (PCDS) was developed to measure nano-sized particle properties by a combination of particle beam mass spectrometry, scanning electron microscopy (SEM), and energy dispersive x-ray spectroscopy (EDS). It allows us to measure the size distributions of nano-sized particles in real time, and the shape and composition can be determined by in situ SEM imaging and EDS scanning. PCDS was calibrated by measuring the size-classified nano-sized NaCl particles generated using an aqueous solution of NaCl by an atomizer. After the calibration, the characteristics of nano-sized particles sampled from the exhaust line of the plasma-enhanced chemical vapor deposition process were determined using PCDS.