Direct deposition of poly-Si Films at a High Rate by Using Catalytic CVD at a low temperature (180 °C)

Tae Hwan Kim, Kyoung Min Lee, Wan Shick Hong

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We studied direct deposition of poly-Si films by using catalytic chemical vapor deposition (CVD) at a low temperature (180 °C). An optimum arrangement of the catalyst wire was investigated. A high deposition rate (300 Å/min) and good adhesion were achieved by controlling the chamber pressure and the gas flow rate. As-deposited films also exhibited a crystalline volume fraction as high as 70 %. We accomplished a high deposition rate, a high crystallinity and a low substrate temperature simultaneously for deposition on plastic substrates.

Original languageEnglish
Pages (from-to)478-483
Number of pages6
JournalJournal of the Korean Physical Society
Volume54
Issue number1 PART 2
DOIs
StatePublished - Jan 2009

Keywords

  • As-deposited poly silicon
  • Catalytic CVD (Cat-CVD)
  • Crystallinity
  • Low temperature
  • Thin-film transistor (TFT)

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