Dislocation strain as the mechanism of phonon scattering at grain boundaries

Hyun Sik Kim, Stephen D. Kang, Yinglu Tang, Riley Hanus, G. Jeffrey Snyder

Research output: Contribution to journalArticlepeer-review

114 Scopus citations

Abstract

Thermal conductivities of polycrystalline thermoelectric materials are satisfactorily calculated by replacing the commonly used Casimir model (freqeuncy-independent) with grain boundary dislocation strain model (frequency-dependent) of Klemens. It is demonstrated that the grain boundaries are better described as a collection of dislocations rather than perfectly scattering interfaces.

Original languageEnglish
Pages (from-to)234-240
Number of pages7
JournalMaterials Horizons
Volume3
Issue number3
DOIs
StatePublished - May 2016

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