Effect of keto defects on the electrical properties of fluorene-based oligomers

Yong Young Noh, Dong Yu Kim, Yuji Yoshida, Kiyoshi Yase, Byung Jun Jung, Eunhee Lim, Hong Ku Shim, Reiko Azumi

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The effect of organic field-effect transistors (OFET) in fluorene end capped fused bithiophene oligomers (BFTT) was examined. Investigations show that the long wavelength emission from the ketonic defects was observed in the photoluminescence spectra of BFTT films. It was found that the formation of keto defects leads to a rapid degradation in the performance of BFTT. The results show that methods were developed to reduce the photo-degradation process of OFET based on fluorene-based oligomers and polymers.

Original languageEnglish
Pages (from-to)2953-2955
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number14
DOIs
StatePublished - 4 Oct 2004

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