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Effects of equivalent oxide thickness on bandgap-engineered SONOS flash memory
Dong Hua Li, Il Han Park, Seongjae Cho, Jang Gn Yun, Jung Hoon Lee, Doo Hyun Kim, Gil Sung Lee, Yoon Kim, Se Hwan Park, Won Bo Shim, Wandong Kim, Byung Gook Park
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations