Electrical properties of SrRuO3 thin films wih varying c-axis lattice constant

Young J. Chang, Jin I. Kim, C. U. Jung

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


We studied the effect of the variation of the lattice constant on the electrical properties of SrRuO3 thin films. In order to obtain films with different volumes, we varied the substrate temperature and oxygen pressure during the growth of the films on SrTiO3 (001) substrates. The films were grown using a pulsed laser deposition method. The X-ray diffraction patterns of the grown films at low temperature and low oxygen pressure indicated the elongation of the c-axis lattice constant compared to that of the films grown at a higher temperature and higher oxygen pressure. The in-plane strain states are maintained for all of the films, implying the expansion of the unit-cell volume by the oxygen vacancies. The variation of the electrical resistance reflects the temperature dependence of the resistivity of the metal, with a ferromagnetic transition temperature inferred form the cusp of the curve being observed in the range from 110 K to 150 K. As the c-axis lattice constant decreases, the transition temperature linearly increases.

Original languageEnglish
Pages (from-to)61-64
Number of pages4
JournalJournal of Magnetics
Issue number2
StatePublished - 2008


  • Ferromagnetic transition
  • Lattice constant
  • Resistivity
  • SrRuO
  • Thin film


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