TY - JOUR
T1 - Electrochemical deposition of Sn-0.7Cu alloy modified with nano-WO3 for high-density mini-LED packaging
AU - Lee, Gyeong Ah
AU - Sharma, Ashutosh
AU - Jung, Jae Pil
N1 - Publisher Copyright:
© The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024.
PY - 2024/5
Y1 - 2024/5
N2 - In this work, Sn-0.7Cu-WO3 nanomodified solders were electrodeposited from an aqueous acidic plating bath containing various fractions of WO3 nanoparticles (0.1, 0.25, 0.5 wt%) NPs for mini-light emitting diodes (mini-LEDs) packaging. The produced nanomodified solders were characterized for their morphology, microhardness, melting point, and electrical resistivity. Further, the nanomodified solder bumps were used to mount a 1608 mini-LED chip/ENIG (Electroless Nickel Immersion Gold) pad by reflowing at 240 °C in the air. High-temperature aging was done at 125 °C for 144, 256, and 400 h and joint shear tests were performed to examine the interfacial properties and growth kinetics of the soldered mini-LED/Sn-0.7Cu-WO3/ENIG joints. The results indicated the formation of (Ni,Cu)3Sn4 intermetallic compounds (IMCs) across the solder/ ENIG pad joint. The thickness of the IMC layer decreases showing the maximum rate of decrease when the composition is Sn-0.7Cu-0.25WO3. It was concluded that the optimal set of microstructure, melting point, electrical resistivity, and joint shear reliability could be achieved when the nanomodified solder is reinforced with 0.25 wt.% WO3 NPs into Sn-0.7Cu matrix and thus it can be a potential contestant for the upcoming applications in mini-LED packaging.
AB - In this work, Sn-0.7Cu-WO3 nanomodified solders were electrodeposited from an aqueous acidic plating bath containing various fractions of WO3 nanoparticles (0.1, 0.25, 0.5 wt%) NPs for mini-light emitting diodes (mini-LEDs) packaging. The produced nanomodified solders were characterized for their morphology, microhardness, melting point, and electrical resistivity. Further, the nanomodified solder bumps were used to mount a 1608 mini-LED chip/ENIG (Electroless Nickel Immersion Gold) pad by reflowing at 240 °C in the air. High-temperature aging was done at 125 °C for 144, 256, and 400 h and joint shear tests were performed to examine the interfacial properties and growth kinetics of the soldered mini-LED/Sn-0.7Cu-WO3/ENIG joints. The results indicated the formation of (Ni,Cu)3Sn4 intermetallic compounds (IMCs) across the solder/ ENIG pad joint. The thickness of the IMC layer decreases showing the maximum rate of decrease when the composition is Sn-0.7Cu-0.25WO3. It was concluded that the optimal set of microstructure, melting point, electrical resistivity, and joint shear reliability could be achieved when the nanomodified solder is reinforced with 0.25 wt.% WO3 NPs into Sn-0.7Cu matrix and thus it can be a potential contestant for the upcoming applications in mini-LED packaging.
UR - http://www.scopus.com/inward/record.url?scp=85192949486&partnerID=8YFLogxK
U2 - 10.1007/s10854-024-12606-4
DO - 10.1007/s10854-024-12606-4
M3 - Article
AN - SCOPUS:85192949486
SN - 0957-4522
VL - 35
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 14
M1 - 953
ER -