Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

Yoon Mi Park; Younju Lee; Joonho So; Changyul Cheon; Young Seek Chung; Hyun Kyo Jung

doi:10.1109/ISEMC.2009.5284664

Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

Yoon Mi Park, Younju Lee, Joonho So, Changyul Cheon, Young Seek Chung, Hyun Kyo Jung

School of Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

In this paper, a new method, based on the combination of Electromagnetic Topology (EMT) and Mode Matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.

Original language	English
Title of host publication	2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Pages	121-126
Number of pages	6
DOIs	https://doi.org/10.1109/ISEMC.2009.5284664
State	Published - 2009
Event	2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin, TX, United States Duration: 17 Aug 2009 → 21 Aug 2009

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Country/Territory	United States
City	Austin, TX
Period	17/08/09 → 21/08/09

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10.1109/ISEMC.2009.5284664

Cite this

Park, Y. M., Lee, Y., So, J., Cheon, C., Chung, Y. S., & Jung, H. K. (2009). Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity. In 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 (pp. 121-126). Article 5284664 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2009.5284664

@inproceedings{f4d058353a504aa3a7c000caf1b0f799,

title = "Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity",

abstract = "In this paper, a new method, based on the combination of Electromagnetic Topology (EMT) and Mode Matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.",

author = "Park, {Yoon Mi} and Younju Lee and Joonho So and Changyul Cheon and Chung, {Young Seek} and Jung, {Hyun Kyo}",

year = "2009",

doi = "10.1109/ISEMC.2009.5284664",

language = "English",

isbn = "9781424442676",

series = "IEEE International Symposium on Electromagnetic Compatibility",

pages = "121--126",

booktitle = "2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009",

note = "2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 ; Conference date: 17-08-2009 Through 21-08-2009",

}

Park, YM, Lee, Y, So, J, Cheon, C, Chung, YS & Jung, HK 2009, Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity. in 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009., 5284664, IEEE International Symposium on Electromagnetic Compatibility, pp. 121-126, 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009, Austin, TX, United States, 17/08/09. https://doi.org/10.1109/ISEMC.2009.5284664

Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity. / Park, Yoon Mi; Lee, Younju; So, Joonho et al.
2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009. 2009. p. 121-126 5284664 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

AU - Park, Yoon Mi

AU - Lee, Younju

AU - So, Joonho

AU - Cheon, Changyul

AU - Chung, Young Seek

AU - Jung, Hyun Kyo

PY - 2009

Y1 - 2009

N2 - In this paper, a new method, based on the combination of Electromagnetic Topology (EMT) and Mode Matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.

AB - In this paper, a new method, based on the combination of Electromagnetic Topology (EMT) and Mode Matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.

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DO - 10.1109/ISEMC.2009.5284664

M3 - Conference contribution

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SN - 9781424442676

T3 - IEEE International Symposium on Electromagnetic Compatibility

SP - 121

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BT - 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009

T2 - 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009

Y2 - 17 August 2009 through 21 August 2009

ER -

Park YM, Lee Y, So J, Cheon C, Chung YS, Jung HK. Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity. In 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009. 2009. p. 121-126. 5284664. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.2009.5284664

Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

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