Electronic structure of p(2 × 3) Ag films on Si(100)

Soon Ki Kim, Jae Sung Kim, Geunseop Lee, Jun Nogami, Ki jeong Kong, Byung Deok Yu, Doyeol Ahn

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The electronic structure of p(2 × 3) Ag films on Si(100) is studied by using electron energy loss spectroscopy (EELS) and scanning tunneling spectroscopy (STS). We observe three energy loss peaks with their loss energies around 1. 28, 1. 63, and 4. 0 eV, respectively. They are assigned to the interband transition in the p(2×3) islands, the interface plasmon between Si(100) and Ag crystallites formed concomitantly with the p(2 × 3) islands, and a combination of the surface plasmon and interband transition of the Ag crystallites, respectively. STS over the p(2 × 3) surface also reveals a band gap around 1 eV in good agreement with the EELS observation of the interband transition. The present observation of the band gap suggests that the p(2 × 3) surface is semiconducting. Furthermore, we examine two models previously proposed for the p(2 × 3) surface against the present experimental observation by ab initio band structure calculations.

Original languageEnglish
Pages (from-to)86-91
Number of pages6
JournalJournal of the Korean Physical Society
Volume62
Issue number1
DOIs
StatePublished - 2013

Keywords

  • Ag
  • EELS
  • Electronics structure
  • First principles calculations
  • Si(100)

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