Abstract
The organic thin field-effect transistor (OTFT) with new 2,5-bis-(50-hexyl-[2,20]bithiophenyl-5-yl)-thieno[3, 2-b]thiophene (T2TT) were examined with various gate dielectrics. The mobility of T2TT semiconductior material strongly depends on interface and insulator properties. The Al 2O3 gate insulator which prepared low temperature plasma enhanced atomic layer deposition (PEALD) method is better performance than silicon oxide insulator.
Original language | English |
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Pages | 1517-1518 |
Number of pages | 2 |
State | Published - 2006 |
Event | 13th International Display Workshops, IDW '06 - Otsu, Japan Duration: 6 Dec 2006 → 6 Dec 2006 |
Conference
Conference | 13th International Display Workshops, IDW '06 |
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Country/Territory | Japan |
City | Otsu |
Period | 6/12/06 → 6/12/06 |