Enhancing simulation feasibility for multi-layer 2D MoS2 RRAM devices: reliability performance learnings from a passive network model
- Seonjeong Lee
- , Yifu Huang
- , Yao Feng Chang
- , Seungjae Baik
- , Jack C. Lee
- , Minsuk Koo
- University of Seoul
- University of Texas at Austin
- Intel
- Samsung
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations