Enhancing SSD reliability through efficient RAID support

Jaeho Kim, Jongmin Lee, Jongmoo Choi, Donghee Lee, Sam H. Noh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

16 Scopus citations

Abstract

A serious problem with current SSDs is its low reliability due to their primary component, flash-memory, that has high error rate and limited erase count. Adopting RAID architecture is a reasonable way to increase reliability of SSDs. In this paper, we propose Dynamic and Variable Size Striping-RAID (DVS-RAID) that dynamically constructs a variable size stripe based on arrival order of write requests such that write requests are sequentially written to a stripe improving the performance and lifetime of SSDs. To increase the reliability of small writes without making use of non-volatile RAM, DVS-RAID employs variable size striping, which constructs a new stripe with data written to portions of a full stripe and writes a parity for that partial stripe. We implement DVS-RAID in the DiskSim SSD extension, and experimental results based on trace-driven simulations show that DVS-RAID out-performs the conventional RAID-5 scheme in terms of performance and lifetime of SSDs.

Original languageEnglish
Title of host publicationProceedings of the Asia-Pacific Workshop on Systems, APSYS'12
DOIs
StatePublished - 2012
EventAsia-Pacific Workshop on Systems, APSYS 2012 - Seoul, Korea, Republic of
Duration: 23 Jul 201224 Jul 2012

Publication series

NameProceedings of the Asia-Pacific Workshop on Systems, APSYS'12

Conference

ConferenceAsia-Pacific Workshop on Systems, APSYS 2012
Country/TerritoryKorea, Republic of
CitySeoul
Period23/07/1224/07/12

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