Environmentally and Electrically Stable Sol-Gel-Deposited SnO2 Thin-Film Transistors with Controlled Passivation Layer Diffusion Penetration Depth That Minimizes Mobility Degradation

Won Yong Lee, Do Won Kim, Hyeon Joong Kim, Kyoungdu Kim, Sin Hyung Lee, Jin Hyuk Bae, In Man Kang, Kwangeun Kim, Jaewon Jang

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