@inproceedings{513712375cff44a686b4cf72b8691fcd,
title = "Evolutionary test case generation from UML-diagram with concurrency",
abstract = "To find equality between software products and artifacts, model-based test (MBT) handles specific representations of software requirement. When those conclude concurrency and loop in MBT, it explosively increases a number of paths are applied by existing coverage criteria. Therefore, in this paper, we propose exploration method to avoid path explosion problem, and solution to generate test data automatically using evolutionary algorithm. The result of practical study shows our proposal's efficiency. Testers, who deal with their project through our approach, could find necessary test path. And our approach makes it possible to generate test data according to various test coverage criteria.",
keywords = "Concurrency, Model-based test, Test data generation, UML diagram",
author = "Seungchan Back and Hyorin Choi and Lee, {Jung Won} and Byungjeong Lee",
note = "Publisher Copyright: {\textcopyright} Springer Nature Singapore Pte Ltd. 2017.; 11th International Conference on Ubiquitous Information Technologies and Applications, CUTE 2016 ; Conference date: 19-12-2016 Through 21-12-2016",
year = "2017",
doi = "10.1007/978-981-10-3023-9_103",
language = "English",
isbn = "9789811030222",
series = "Lecture Notes in Electrical Engineering",
publisher = "Springer Verlag",
pages = "674--679",
editor = "Vincenzo Loia and {Jong Hyuk Park}, {James J.} and Gangman Yi and Yi Pan",
booktitle = "Advances in Computer Science and Ubiquitous Computing - CSA-CUTE2016",
address = "Germany",
}