Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates

H. S. Lee; S. Yi; T. W. Kim; Y. J. Park; J. Y. Lee; M. S. Kwon; H. L. Park

doi:10.1016/j.ssc.2005.10.007

Existence of a Cu₃Au-type ordered structure in Cd _xZn_1-xTe epilayers grown on (100) GaAs substrates

H. S. Lee, S. Yi, T. W. Kim, Y. J. Park, J. Y. Lee, M. S. Kwon, H. L. Park

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in Cd_xZn_1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu₃Au-type ordered structure was formed in the Cd_xZn_1-xTe epilayer. The present results can help improve understanding of the Cu₃Au-type ordered structures in Cd_xZn_1-xTe epilayers grown on GaAs substrates.

Original language	English
Pages (from-to)	70-73
Number of pages	4
Journal	Solid State Communications
Volume	137
Issue number	1-2
DOIs	https://doi.org/10.1016/j.ssc.2005.10.007
State	Published - Jan 2006

Keywords

A. Semiconductor
C. Transmission electron microscopy
D. Order-disorder effects

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10.1016/j.ssc.2005.10.007

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title = "Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates",

abstract = "Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.",

keywords = "A. Semiconductor, C. Transmission electron microscopy, D. Order-disorder effects",

author = "Lee, {H. S.} and S. Yi and Kim, {T. W.} and Park, {Y. J.} and Lee, {J. Y.} and Kwon, {M. S.} and Park, {H. L.}",

year = "2006",

month = jan,

doi = "10.1016/j.ssc.2005.10.007",

language = "English",

volume = "137",

pages = "70--73",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd.",

number = "1-2",

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TY - JOUR

T1 - Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates

AU - Lee, H. S.

AU - Yi, S.

AU - Kim, T. W.

AU - Park, Y. J.

AU - Lee, J. Y.

AU - Kwon, M. S.

AU - Park, H. L.

PY - 2006/1

Y1 - 2006/1

N2 - Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.

AB - Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.

KW - A. Semiconductor

KW - C. Transmission electron microscopy

KW - D. Order-disorder effects

UR - http://www.scopus.com/inward/record.url?scp=28844466076&partnerID=8YFLogxK

U2 - 10.1016/j.ssc.2005.10.007

DO - 10.1016/j.ssc.2005.10.007

M3 - Article

AN - SCOPUS:28844466076

SN - 0038-1098

VL - 137

SP - 70

EP - 73

JO - Solid State Communications

JF - Solid State Communications

IS - 1-2

ER -

Existence of a Cu₃Au-type ordered structure in Cd _xZn_1-xTe epilayers grown on (100) GaAs substrates

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Keywords

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