Abstract
In this report, a novel tunnel field-effect transistor (TFET) named 'F-shaped TFET' has been proposed and its electrical characteristics are analyzed and optimized by using a computer-aided design simulation. It features ultra-thin and a highly doped source surrounded by lightly doped regions. As a result, it is compared to an L-shaped TFET, which is a motivation of this work, the F-shaped TFET can lower turn-on voltage (VON) maintaining high on-state current (ION) and low subthreshold swing (SS) with the help of electric field crowding effects. The optimized F-shaped TFET shows 0.4 V lower VON than the L-shaped TFET with the same design parameter. In addition, it shows 4.8 times higher ION and 7 mV/dec smaller average SS with the same VON as that for L-shaped TFET.
Original language | English |
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Article number | 760 |
Journal | Micromachines |
Volume | 10 |
Issue number | 11 |
DOIs | |
State | Published - 1 Nov 2019 |
Keywords
- Band-to-band tunneling
- Corner effect
- Electric field crowding
- L-shaped TFET
- Line tunneling
- Tunnel field-effect transistor (TFET)