Fast image scanning method in liquid-AFM without image distortion

Inhee Choi, Younghun Kim, Jong Ho Kim, Young In Yang, Jeongjin Lee, Suseung Lee, Surin Hong, Jongheop Yi

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


High speed imaging by atomic force microscopy (AFM) allows one to directly observe the dynamic behavior of a sample surface immersed in liquid media; thus, it has been considered to be an indispensable tool for nanobiotechnology and is used in many research fields, including molecular biology and surface science. For real-time observation of a certain behavior, the high speed imaging technique should be accompanied with a high resolution imaging technique to identify target materials. To improve the image quality at a high scanning rate, we developed a variable-controlled fast scanning method, which originated from the modified squeeze-drag superposition model in liquid media. A collection of non-distorted images was accomplished after proper modification of the operating conditions in a viscous fluid, via the simple handling of loading force and cantilever length. Consequently, a speeded-up AFM imaging process was achieved in the liquid environment at up to 200 μm s-1, without attachment of additional devices. The reliability of the proposed method was verified by the characterization of a grating sample immersed in three types of liquid media. In addition, the results were visualized for elastic biomolecules submerged in a liquid with high kinematic viscosity.

Original languageEnglish
Article number445701
Issue number44
StatePublished - 5 Nov 2008


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