Favorable formation of the C49-TiSi2 phase on Si(001) determined by first-principles calculations

B. D. Yu, Yoshiyuki Miyamoto, Osamu Sugino, T. Sasaki, T. Ohno

Research output: Contribution to journalArticlepeer-review

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Abstract

Using first-principles total-energy calculations, we investigated the atomic structure of a very thin Ti film on Si(001) and their intermixing. Our calculations show that the Ti film forms a pseudomorphic body-centered-tetragonal structure on Si(001). We found that intermixing of Ti and Si atoms energetically favors the formation of a C49-TiSi2 phase. We propose a plausible explanation of how the C49-TiSi2 phase and the interfacial structure between C49 phase and Si(001) are formed. We discuss why the transformation of the C49 phase into the C54 phase is inhibited when the TiSi2 dimensions reach the submicron region.

Original languageEnglish
Pages (from-to)1176-1178
Number of pages3
JournalApplied Physics Letters
Volume72
Issue number10
DOIs
StatePublished - 1998

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