Fluoroalkylated tin-oxo nano clusters as resist candidates for extreme UV lithography

Yejin Ku, Hyungju Ahn, Jin Kyun Lee, Jiho Kim, Byeong Gyu Park, Sangsul Lee, Yu Ha Jang, Byung Jun Jung, Chawon Koh, Tsunehiro Nishi, Hyun Woo Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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