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Fowler-Nordheim Stress-Induced Degradation of Buried-Channel-Array Transistors in DRAM Cell for Cryogenic Memory Applications
Sungju Choi, Ga Won Yang, Sangwon Lee, Jingyu Park, Changwook Kim, Jun Park, Hyun Seok Choi, Namhyun Lee, Gang Jun Kim, Yoon Kim, Myounggon Kang, Changhyun Kim, Jong Ho Bae, Dae Hwan Kim
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations