GEM: performance and aging tests

H. S. Cho, J. Kadyk, S. H. Han, W. S. Hong, V. Perez-Mendez, W. Wenzel, K. Pitts, M. D. Martin, J. B. Hutchins

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Performance and aging tests have been done to characterize Gas Electron Multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
PublisherIEEE
Pages589-593
Number of pages5
ISBN (Print)0780350227
StatePublished - 1999
EventProceedings of the 1998 IEEE Nuclear Science Symposium Conference Record - Toronto, Que, Can
Duration: 8 Nov 199814 Nov 1998

Publication series

NameIEEE Nuclear Science Symposium and Medical Imaging Conference
Volume1

Conference

ConferenceProceedings of the 1998 IEEE Nuclear Science Symposium Conference Record
CityToronto, Que, Can
Period8/11/9814/11/98

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