GEM: Performance and aging tests

H. S. Cho, J. Kadyk, S. H. Han, W. S. Hong, V. Perez-Mendez, W. Wenzel, K. Pitts, M. D. Martin, J. B. Hutchins

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Performance and aging tests have been done to characterize Gas Electron Multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities.

Original languageEnglish
Pages (from-to)306-311
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume46
Issue number3 PART 1
DOIs
StatePublished - 1999

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