Importance of Structural Relaxation on the Electrical Characteristics and Bias Stability of Solution-Processed ZnSnO Thin-Film Transistors

Yu Jin Hwang, Do Kyung Kim, Sang Hwa Jeon, Ziyuan Wang, Jaehoon Park, Sin Hyung Lee, Jaewon Jang, In Man Kang, Jin Hyuk Bae

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

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